DC static, AC dynamic, RgCg, leakage, recovery and short-circuit tests
R&D · ENGINEERING VALIDATION
Laboratory Test Platform
A flexible engineering platform for static and dynamic device research, parameter-curve development and controlled thermal evaluation.
MODEL / PLATFORMLAB CONFIGURATION
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Company catalogue reference · P14–1501LAB CONFIGURATIONPLATFORM
02Device R&DTypical applications
03−55 to 200 °CTemperature range
04P14–15Company catalogue reference
System highlights
Interface, load and safety configuration can be tailored to the engineering objective.
Controlled low- and high-temperature testing from −55 to 200 °C
Low-inductance loop below 10 nH, configurable to 6 nH
Safety enclosure and adjustable air-core load inductance
Catalogue specifications
Laboratory Test Platform
Technical data shown is based on the current WYJ product catalogue. Final configuration is application-specific.
01Temperature range
−55 to 200 °C
02Loop inductance
<10 nH, down to 6 nH by design
03Dynamic bus
50–3000 V, upgradeable
04Static current
Up to 2000 A
05Protection
<1.5 μs short-circuit response
06Modes
Debug / engineering / production method development
Typical applications
Device coverage
01Device R&D
02Datasheet characterization
03Thermal evaluation
04Test-method development
APPLICATION ENGINEERING · SHENZHEN