EAS avalanche, Rth thermal resistance, DC, AC, RgCg and ISO tests
PRODUCTION · DEVICE SORTING
Discrete Semiconductor & IPM Test
Configurable test and sorting platforms for discrete power semiconductors and intelligent power modules across DC, AC and reliability routines.
MODEL / PLATFORMTO / IPM SERIES
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Company catalogue reference · P12–1301TO / IPM SERIESPLATFORM
02Discrete-device sortingTypical applications
03>6000 UPH for discrete devicesSorting throughput
04P12–13Company catalogue reference
System highlights
Available as integrated or modular stations according to device package and test mix.
TO-series discrete and IPM automatic feeding and sorting
Five-station parallel DC + EAS + RgCg + Rth + ISO configuration
Diode, MOSFET, IGBT, SiC, IPM and PIM coverage
Catalogue specifications
Discrete Semiconductor & IPM Test
Technical data shown is based on the current WYJ product catalogue. Final configuration is application-specific.
01Sorting throughput
>6000 UPH for discrete devices
02Dynamic bus
1000 / 1500 / 2000 V, 3000 V option
03DC voltage
2000 V standard, 4000 V expandable
04RgCg sweep
20 Hz–1 MHz
05Temperature
Up to 200 °C
06Loop inductance
<30 nH
Typical applications
Device coverage
01Discrete-device sorting
02IPM production
03EAS / Rth characterization
04High-volume screening
APPLICATION ENGINEERING · SHENZHEN