Laboratory + dynamic + static
Choose by test objective, device and production stage.
Eight focused system families follow the same sequence as the WYJ product catalogue—from reliability and characterization to FT, KGD and supporting hardware.
Find the right entry point
Reactive power aging
FT + discrete/IPM
KGD / wafer

Reactive Power Aging System
Automated reactive-current cycling for IGBT and SiC power modules, integrating loading, test, monitoring, drying and binning in one reliability workflow.

Two- & Three-Level Dynamic Test Systems
Application-oriented switching characterization for IGBT and SiC devices, with two-level and three-level topologies on a production-ready platform.

Static Parameter Test Systems
High-voltage, high-current DC characterization for power modules, DBC/AMB substrates and discrete devices—from engineering validation to production screening.

Automated Final Test Cells
A configurable production cell combining insulation, static, dynamic, visual and curvature inspection with robotic loading and modular fixtures.

Discrete Semiconductor & IPM Test
Configurable test and sorting platforms for discrete power semiconductors and intelligent power modules across DC, AC and reliability routines.

Laboratory Test Platform
A flexible engineering platform for static and dynamic device research, parameter-curve development and controlled thermal evaluation.

Known Good Die Test System
Automated AC/DC and visual screening for SiC wafer-level die, separating good and defective devices before module integration.

Fixtures, Inductors & Safety Integration
Application-specific air-core inductors, low-inductance fixtures and high-voltage safety enclosures that complete the test environment.
