PRODUCT SYSTEMS

Choose by test objective, device and production stage.

Eight focused system families follow the same sequence as the WYJ product catalogue—from reliability and characterization to FT, KGD and supporting hardware.

Find the right entry point

01R&D

Laboratory + dynamic + static

02Reliability

Reactive power aging

03Production

FT + discrete/IPM

04Die selection

KGD / wafer

Reactive Power Aging System
01 · RELIABILITY · MODULE LIFECYCLE

Reactive Power Aging System

Automated reactive-current cycling for IGBT and SiC power modules, integrating loading, test, monitoring, drying and binning in one reliability workflow.

WFP6000 6IN1P04–05
Two- & Three-Level Dynamic Test Systems
02 · CHARACTERIZATION · SWITCHING

Two- & Three-Level Dynamic Test Systems

Application-oriented switching characterization for IGBT and SiC devices, with two-level and three-level topologies on a production-ready platform.

WTDS2015 / WTTDS2015P06–07
Static Parameter Test Systems
03 · CHARACTERIZATION · DC PARAMETERS

Static Parameter Test Systems

High-voltage, high-current DC characterization for power modules, DBC/AMB substrates and discrete devices—from engineering validation to production screening.

WTSS SERIESP08–09
Automated Final Test Cells
04 · PRODUCTION · INTEGRATED FT

Automated Final Test Cells

A configurable production cell combining insulation, static, dynamic, visual and curvature inspection with robotic loading and modular fixtures.

CONFIGURABLE FT CELLP10–11
Discrete Semiconductor & IPM Test
05 · PRODUCTION · DEVICE SORTING

Discrete Semiconductor & IPM Test

Configurable test and sorting platforms for discrete power semiconductors and intelligent power modules across DC, AC and reliability routines.

TO / IPM SERIESP12–13
Laboratory Test Platform
06 · R&D · ENGINEERING VALIDATION

Laboratory Test Platform

A flexible engineering platform for static and dynamic device research, parameter-curve development and controlled thermal evaluation.

LAB CONFIGURATIONP14–15
Known Good Die Test System
07 · WAFER · DIE SELECTION

Known Good Die Test System

Automated AC/DC and visual screening for SiC wafer-level die, separating good and defective devices before module integration.

KGD / CP PLATFORMP16–17
Fixtures, Inductors & Safety Integration
08 · INTEGRATION · TEST INTERFACE

Fixtures, Inductors & Safety Integration

Application-specific air-core inductors, low-inductance fixtures and high-voltage safety enclosures that complete the test environment.

APPLICATION-SPECIFICP18
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APPLICATION ENGINEERING · SHENZHEN

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