DEVICES & APPLICATIONS

Configured around the device. Ready for the line.

System architecture is selected from device technology, package, test objective, thermal condition and production stage.

Device coverage

Device coverage

01

IGBT modules

Static, dynamic, aging and automated FT for automotive and industrial module formats.

02

SiC MOSFET

High-speed switching, short-circuit, wafer-level KGD and high-temperature evaluation.

03

Discrete devices

Diode, MOSFET, IGBT and SiC DC/AC test with automatic sorting.

04

DBC / AMB

Semi-finished substrate characterization before final module assembly.

05

IPM / PIM

Integrated module characterization and configurable production screening.

06

Wafer & die

CP, AC/DC test, AOI and known-good-die handling before packaging.

Application domains

Application domains

01

xEV & charging

Traction inverter, OBC and charging power-module validation.

02

Industrial control

Inverter, servo and high-reliability power conversion.

03

Renewable energy

Photovoltaic, energy storage and power conversion systems.

04

Consumer & power

High-volume power-device screening and module final test.

APPLICATION ENGINEERING · SHENZHEN

Bring us the next test challenge.